Circuit reliability
Circuit reliability (also time availability) (CiR) is the percentage of time an electronic circuit was available for use in a specified period of scheduled availability. Circuit reliability is given by
- Failed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle T_s = T_a + T_o}
where Failed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle T_o} is the circuit total outage time, Failed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle T_s} is the circuit total scheduled time, and Failed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle T_a} is the circuit total available time. In addition, circuit reliability is the expected lifespan of operation of a functioning system under nominal conditions.
References
This article incorporates public domain material from the General Services Administration document: "Federal Standard 1037C". (in support of MIL-STD-188)